Software Failure Investigation
117,69 €*
Nach dem Kauf zum Download bereit Ein Downloadlink ist wenige Minuten nach dem Kauf im eigenen Benutzerprofil verfügbar.
ISBN/EAN:
9783319613345
This book reviews existing operational software failure analysis techniques and proposes near-miss analysis as a novel, and new technique for investigating and preventing software failures. The authors provide details on how near-miss analysis techniques focus on the time-window before the software failure actually unfolds, so as to detect the high-risk conditions that can lead to a major failure. They detail how by alerting system users of an upcoming software failure, the detection of near misses provides an opportunity to collect at runtime failure-related data that is complete and relevant. They present a near-miss management systems (NMS) for detecting upcoming software failures, which can contribute significantly to the improvement of the accuracy of the software failure analysis. A prototype of the NMS is implemented and is discussed in the book. The authors give a practical hands-on approach towards doing software failure investigations by means of near-miss analysis that is of use to industry and academia
Professor Jan Eloff graduated in 1985 with a PhD in Computer Science. Up to June 2015 he was appointed as the Research Director for SAP Research in Africa and is currently appointed as Deputy Dean Research & Postgraduate studies: Faculty of Eng., Built Environment and IT (EBIT) and as a full professor in computer science at the University of Pretoria. From 2007 he is an associate-editor of the Computers & Security journal and an editorial member for the international Computer Fraud & Security bulletin published by Elsevier. He is an internationally recognised researcher and has published 113 peer reviewed papers with 3537 citations.
Dr. Madeleine Bihina Bella has over 10 years of industry experience with expertise in IT security and business analysis working in leading roles in a number of multinationals across various industries. She is also a part-time computer science lecturer. In 2015 she graduated with a PhD in Computer Science from the University of Pretoria specializing in the field of digital forensics. Her research focused on near-miss analysis as a novel technique to improve the forensic investigation of software failures. '. She received a number of awards for her doctoral research including the South African Women in Science Award, the Google Women Techmakers sholarship and the L'Oréal/UNESCO Regional Fellowship for Women in Science in Sub-Saharan Africa. She has published a number of journal and conference papers.
| Autor: | Jan Eloff, Madeleine Bihina Bella |
|---|---|
| EAN: | 9783319613345 |
| eBook Format: | |
| Sprache: | English |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 07.09.2017 |
| Untertitel: | A Near-Miss Analysis Approach |
| Kategorie: | |
| Schlagworte: | Digital forensics Downtime Failure analysis Forensic investigation Near-miss analysis Near-miss management system (NMS) Reliability Root-cause analysis Software failure |
Anmelden
Möchten Sie lieber vor Ort einkaufen?
Haben Sie weiterführende Fragen zu diesem Buch oder anderen Produkten? Oder möchten Sie einfach doch lieber in der Buchhandlung stöbern? Wir sind gern persönlich für Sie da und beraten Sie auch telefonisch.
Buchhandlung Nettesheim GmbH
Hauptstraße 17
42349 Wuppertal
Telefon: 0202/472870
Mo – Fr09:30 – 18:00 UhrSa09:00 – 13:00 Uhr